KELTEK
RESEARCH
KELTEK, LLC Edward F. Kelley, Ph.D. Consulting Physicist |
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MAIN
LABORATORY DARKROOM
This laboratory is designed to
be flexible in order to research virtually any
measurement problem on any commercial display
technology that is required. We retain a
spectroradiometric measurement capability (courtesy
Photo Research, Inc.) for general display
measurements: full-screen and box, luminance, color,
correlated color temperature (CCT), viewing angle,
gamma, bidirectional
reflectance distribution function (BRDF) measurements
(both photometric and spectroradiometric), temporal
measurements, motion-artifact measurements, 3D measurements, etc.
Alignment of our apparatus is achieved by a
laser whereby we routinely obtain alignment with the
display normal to within two minutes of arc whenever
necessary. The laboratory is constantly being enhanced
with more capabilities.
We specialize in reflection measurements on displays whereby we can replicate most reflection apparatus required. We have integrating spheres, sampling spheres, discrete, uniform, and collimated sources all available for reflection characterization of displays and the measurement of contrasts and colors under ambient conditions. We measure reflectance factors, reflectances, character contrasts and character reflectances under ambient conditions (specular included or excluded, photometric or radiometric measurements as needed). We also measure transmission characteristics of displays and components. FUTURE DIRECTIONS
We intend to improve
and increase our measurement capabilities
including
matrix-scatter characterization, transmission
measurements, and projection measurements.
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RESEARCH
EXPERIENCE:
Display Metrology at
NIST (1992-2009 )
Research with NIST and University Teaching (1989-1992) Liquid Dielectrics & Electrical Breakdown at NIST (1977-1989) HV Pulse Measurements, High-Speed Photography (at High Magnification), and Dielectric Breakdown |
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KELTEK began
in 1989 as a sole proprietorship when Ed first
left NIST and moved to Idaho. He continued to work with
NIST via personal-services contracts for a while and
explored university teaching. He returned to NIST in
1992 where he started the Flat Panel Display Laboratory
that ultimately became the Display Metrology Project, a
work that continued for 17 years. (KELTEK went dormant
as long as Ed worked at NIST.) KELTEK revived after Ed's
retirement from NIST in 2009. Ed will continue his
passion for quality display metrology doing research in
display measurements. Presently, the Display Metrology
Short Course has been suspended in anticipation of a
book, Display Metrology. |
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Certain commercial equipment, instruments, materials, systems, software, and trade names may be identified throughout this site in order to specify or identify technologies adequately. Such identification is not intended to imply recommendation or endorsement by KELTEK, nor is it intended to imply that the systems or products identified are necessarily the best available for the purpose. | ||||||
© KELTEK, LLC. All the contents of this web page and the KELTEK web pages to which it links are the property of KELTEK, LLC. Do not copy, etc., any item without written permission from KELTEK; contact us at the above email address. Thanks, --Ed. | ||||||
Updated 20160519T0839 |